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DEPOSITION OF SILICON CONTAINING FILMS AND FTIR DIAGNOSTICS

    https://doi.org/10.1142/9781860945380_0003Cited by:1 (Source: Crossref)
    Abstract:

    The following sections are included:

    • Introduction

    • Precursors

    • Species Detected in Organosilicon Plasmas

      • Optical Emission Spectroscopy (OES)

      • Mass Spectroscopy

      • Infrared Absorbtion Spectroscopy of the Plasma

        • Principles of FTIR Diagnostic of the Plasma Phase

        • The Absorption Spectra

        • Quantitative Analysis (Absorption Spectrometry)

        • Infrared Diagnostics of Organosilicon Plasma

    • Open Questions and Conclusions

      • Species in the Gas Phase

      • Interface Plasma-Surface; Growing Mechanism

    • References