HIGH RESOLUTION PIXE USING CRYSTAL SPECTROMETER COMBINED WITH POSITION SENSITIVE DETECTORS

We describe characteristics of high-resolution, wavelength-dispersive crystal spectrometers equipped with a different type of position sensitive X-ray detectors: PSPC, CCD, IP and MCP. Utilities of these position sensitive spectrometers in PIXE experiments are demonstrated by referring several recent topics of elemental analysis, chemical state analysis and a study on sample charging.