Special Section on Radiation Effects and Fault Tolerance in Electronic Devices, Circuits, and Systems - Guest Editors: M. Krstic (University of Potsdam, Germany) and M. Carvajal (University of Granada, Spain)
Open Access
- Sandra Veljković,
- Nikola Mitrović,
- Vojkan Davidović,
- Snežana Golubović,
- Snežana Djorić-Veljković,
- Albena Paskaleva,
- Dencho Spassov,
- Srboljub Stanković,
- Marko Andjelković,
- Zoran Prijić,
- Ivica Manić,
- Aneta Prijić,
- Goran Ristić, and
- Danijel Danković
https://doi.org/10.1142/S0218126622400035
Special Section on Radiation Effects and Fault Tolerance in Electronic Devices, Circuits, and Systems - Guest Editors: M. Krstic (University of Potsdam, Germany) and M. Carvajal (University of Granada, Spain)
No Access
https://doi.org/10.1142/S0218126622400060
Special Section on Radiation Effects and Fault Tolerance in Electronic Devices, Circuits, and Systems - Guest Editors: M. Krstic (University of Potsdam, Germany) and M. Carvajal (University of Granada, Spain)
Open Access
https://doi.org/10.1142/S0218126622400072
Special Section on Radiation Effects and Fault Tolerance in Electronic Devices, Circuits, and Systems - Guest Editors: M. Krstic (University of Potsdam, Germany) and M. Carvajal (University of Granada, Spain)
No Access
https://doi.org/10.1142/S0218126622400084
Special Section on Radiation Effects and Fault Tolerance in Electronic Devices, Circuits, and Systems - Guest Editors: M. Krstic (University of Potsdam, Germany) and M. Carvajal (University of Granada, Spain)
No Access
https://doi.org/10.1142/S0218126622400096